There were 1,815 press releases posted in the last 24 hours and 478,609 in the last 365 days.

Advanced Metrology for Defect Management in Ceramic Additive Manufacturing

Additive manufacturing (AM) of ceramic components suffers from inconsistent quality and high defect rates due to a lack of standardized feedstock characterization and handling protocols, inadequate in-process monitoring capabilities, and insufficient post-production non-destructive evaluation methods. While metrology approaches are in development to detect critical flaws like microcracking, porosity, and dimensional deviations in complex ceramic geometries, the transfer of these solutions to industrial stakeholders remains limited, constraining widespread adoption and preventing ceramics AM from reaching its full potential in high-performance applications such as aerospace, medical devices, and energy systems. This workshop will convene leading experts in ceramics manufacturing, metrology instrumentation, and AM process control to develop a comprehensive 3-year roadmap identifying critical measurement gaps, prioritizing technology development needs, and establishing validation protocols.

 

Legal Disclaimer:

EIN Presswire provides this news content "as is" without warranty of any kind. We do not accept any responsibility or liability for the accuracy, content, images, videos, licenses, completeness, legality, or reliability of the information contained in this article. If you have any complaints or copyright issues related to this article, kindly contact the author above.