November 19, 2009 (FinancialWire) — LTX-Credence Corp. (NASDAQ: LTXC), a provider of innovative semiconductor ATE solutions, announced a new multi-channel, high precision AC and DC instrument for the X-Series test platform.

Each Data Converter Test Module contains 16 independent differential channels for high volume testing of precision analog devices. This level of integration delivers unprecedented capability for multi-site testing of devices in automated test equipment.

DCTM’s precision capability and instrument density lowers engineering expense, dramatically reduces test costs, and enhances product yields. In addition to data converters, the DCTM supports the testing of other high performance devices including audio amplifiers, temperature sensors and linear devices for both static and dynamic test.

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