September 3, 2009 (FinancialWire) — LTX-Credence Corp. (NASDAQ: LTXC), a global provider of focused, cost-optimized ATE solutions, announced that Ralink Technology Corp., a leading innovator and developer of 802.11x wireless LAN chipset solutions, has selected the X-Series for its next generation wireless test platform.

The X-Series will be used for multisite production testing of 802.11x chipset solutions and is currently available at several Taiwan-based subcontract test providers. The X-Series test system was chosen for its high performance wireless/RF test capabilities, local support in Taiwan and China provided through Spirox, and LTXC’s extensive wireless/RF test expertise, all applied to deliver a lower cost of test compared to other test systems.

“We selected the LTXC X-Series platform because of its qualified and proven capabilities to meet our production requirements for testing our 802.11n SoC device. Its capability to test RF, mixed signal and digital within a single platform is important,” said Dr. Dennis Lo, senior vice president of Ralink Technology. “In addition, the X-Series has provided a compelling flexible testing configuration and throughput advantage over other testing platforms. We are also pleased with the seamless support provided by LTXC and Spirox in assisting us with the test program development and release to manufacturing processes.”

“We are excited to be working with an innovative WLAN chipset developer like Ralink,” said Bruce MacDonald, vice president of marketing at LTX-Credence. “Wireless/RF test has been a long-time core competency for the company. Our solutions consistently deliver better results for our customers compared to competing solutions. We have significant market share in RF and we plan to continue to gain share in this important market segment by delivering leading RF test technology that drives down our customers’ cost of test.”

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